ISSN: 1683-3198
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e-ISSN: 2309-4524
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DOI: 10.34028/iajit
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The International Arab Journal of Information Technology
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A Probabilistic Approach to Building Defect Prediction Model for Platform-based Product Lines
Changkyun Jeon,Neunghoe Kim,Hoh In
#Defect prediction
#defect life cycle
#markov chain
#product line engineering
#software engineering
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